DocumentCode
3225660
Title
A diagnosis method of DC/DC converter aging based on the variation of parasitic
Author
Tae-Jin, Kim ; Baek, Ju-Won ; Jeon, Jin-Hong ; Rim, Geun-Hie ; Kim, Cheul-U
Author_Institution
Power Electron. Res. Group, Korea Electrotechnol. Res. Inst., Changwon, South Korea
Volume
3
fYear
2004
fDate
2-6 Nov. 2004
Firstpage
3037
Abstract
In this paper, we propose a new diagnosis method of DC/DC converter aging. The method is based on the variations of parasitic resistor for the aging process. We apply an on-line diagnosis of DC/DC converter from the system point of view, not device-wise, but a system. This study proposes a method of DC/DC converter diagnosis by analyzing the variations of model on the variations of parasitic resistor.
Keywords
DC-DC power convertors; ageing; resistors; DC-DC converter aging; on-line diagnosis method; parasitic resistor; Accidents; Aging; Communication industry; DC-DC power converters; Industrial electronics; Machinery; Noise measurement; Resistors; Semiconductor device noise; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, 2004. IECON 2004. 30th Annual Conference of IEEE
Print_ISBN
0-7803-8730-9
Type
conf
DOI
10.1109/IECON.2004.1432296
Filename
1432296
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