• DocumentCode
    3225864
  • Title

    Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model

  • Author

    Durier, Andre ; Marot, Christian ; Crepel, Olivier

  • Author_Institution
    Continental Automotive France SAS, Toulouse, France
  • fYear
    2013
  • fDate
    15-18 Dec. 2013
  • Firstpage
    152
  • Lastpage
    157
  • Abstract
    DC/DC Boost Converters are commonly used in the electronics industry to provide a raised voltage to a specific function. These converters are constituted by a basic commutation cell (Inductor-MOS transistor-diode-capacitor) managed by an integrated circuit realizing voltage and current control typically running between 100 and 500 kHz. This control´s frequency creates high conducted Electromagnetic noise which could cause troubles on the supply network. We propose to use a SPICE modeling to estimate the conducted noise on supply network during CISPR 25 CE measurements. Then, we will intend to build an EBEM-CE model of the converter from these measurements.
  • Keywords
    DC-DC power convertors; MOSFET; capacitors; electric current control; inductors; voltage control; CISPR 25 CE measurements; DC-DC boost converter; EBEM-CE model; EM simulation tools; MOS transistor-diode-capacitor; SPICE modeling; basic commutation cell; conducted emissions level; conducted noise; current control; electromagnetic noise; electronics industry; inductor; supply network; voltage control; Current measurement; Electromagnetic compatibility; Integrated circuit modeling; Noise; SPICE; Voltage measurement; CISPR 25 Conducted Emissions; DC/DC Boost Converter; EBEM CE model; SPICE modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/EMCCompo.2013.6735191
  • Filename
    6735191