Title :
Transmission X-ray diffraction studies on Bi4Ti3O12 single crystals
Author :
Salazar, U. ; Mendoza, M.E.
Author_Institution :
Inst. de Fis., Benemerita Univ. Autonoma de Puebla, Puebla, Mexico
Abstract :
Single crystals of bismuth titanate were grown by high temperature solution method using bismuth oxide as a flux. Domain structure in (001) polished platelets was investigated by optical microscopy. 90° domains and needle-like domains were observed. Transmission X-ray diffraction experiments on the same platelets were performed in order to evaluate the strain associated to domain walls. It was found that the splitting of the (220) peak always appeared by 90° rotation of the sample stage. The separation between (220) planes in the tilted cell was calculated and it was found to be 1.91 Å. Moreover, the splitting of (220) peak is very sharp after thermal cycles around TC, this could be associated to the lower number of domain walls observed after these thermal cycles.
Keywords :
X-ray diffraction; bismuth compounds; crystal growth from solution; electric domain walls; ferroelectric materials; optical microscopy; (001) polished platelets; Bi4Ti3O12; bismuth oxide; bismuth titanate single crystals; domain structure; domain walls; ferroelectric materials; high temperature solution method; needle-like domains; optical microscopy; thermal cycles; transmission X-ray diffraction; Bismuth; Crystals; Microscopy; Optical microscopy; Titanium compounds; X-ray diffraction; X-ray scattering; Bismuth titanate; domain walls; transmission XRD;
Conference_Titel :
Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1162-6
Electronic_ISBN :
978-1-4577-1161-9
DOI :
10.1109/ISAF.2011.6013993
