• DocumentCode
    3226262
  • Title

    Thermal performance of an integral immersion cooled multichip module package

  • Author

    Nelson, Richard D. ; Sommerfeldt, Scott ; BarCohen, A.

  • Author_Institution
    Microelectronics & Computer Technology Corp., Austin, TX, USA
  • fYear
    1993
  • fDate
    2-4 Feb 1993
  • Firstpage
    8
  • Lastpage
    18
  • Abstract
    A multichip module (MCM) package which uses integral immersion cooling to transfer heat from the chips to a final heat transfer medium outside the package was constructed. The package is a miniature immersion-cooled system with a pin-fin condenser which can be operated in either the submerged or vapor-space condensing mode. Sixteen chips were bonded on a 57 mm2 alumina substrate carrying copper/polyimide thin film interconnect. Tests of the thermal performance of the system show that it is capable of handling over 160 W power with chip thermal resistances as low as 2 K-cm2/W provided by the immersion cooled portion of the thermal path. Tests performed with the module fully powered and with subsets of the chips powered indicate that the heat transfer coefficient is similar in all partially powered modes. Data taken with condenser temperatures ranging from 20 to 50°C were used to obtain a performance map delineating the heat transfer regimes in the module and the limits imposed by critical heat flux and condenser performance
  • Keywords
    cooling; multichip modules; packaging; 160 W; 20 to 50 degC; chip thermal resistances; condenser performance; copper/polyimide thin film interconnect; critical heat flux; heat transfer coefficient; heat transfer medium; heat transfer regimes; integral immersion cooled; multichip module package; partially powered modes; pin-fin condenser; vapor-space condensing mode; Bonding; Copper; Heat transfer; Immersion cooling; Multichip modules; Packaging; Polyimides; Substrates; Thermal resistance; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1993. SEMI-THERM IX., Ninth Annual IEEE
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0863-8
  • Type

    conf

  • DOI
    10.1109/STHERM.1993.225336
  • Filename
    225336