Simplified neutral atom microscopy

For some decades scientists have been interested the possibility of imaging surfaces using a focused beam of neutrally charged atoms or molecules. Scattering of neutral atoms provides a low-energy, surface-sensitive probe, and imaging with this could result in new insights. However, it has been difficult to form a sharply focused and sufficiently intense beam of neutral particles. The first image from such a microscope was published in 2008. We have succeeded with a new approach, using pinhole optics and a mechanically scanned sample. Resolution has reached 3 μm. Recent images and design theory are presented.