Title :
Orientational dependence of multiferroic behaviors of La and Mn modified BiFeO3 thin films
Author :
Wang, D.Y. ; Chan, N.Y. ; Zheng, R.K. ; Kong, C. ; Li, Sinan ; Chan, H.L.W.
Author_Institution :
Sch. of Mater. Sci. & Eng., Univ. of New South Wales, Sydney, NSW, Australia
Abstract :
Orientation engineered (La, Mn) co-substituted BiFeO3 [BFOLM] thin films were deposited on CaRuO3 buffered (LaAlO3)0.3(Sr2AlTaO6)0.35 [LSAT] [001], [110] and [111] single crystal substrates, respectively, by pulsed laser deposition. Highly epitaxial growth and sharp interfaces of the BFOLM /CaRuO3/LSAT heterostructures were revealed by x-ray diffraction and high resolution transmission electron microscopy. Their ferroelectric and ferromagnetic properties are strongly dependent on the crystallographic orientation. At 1 kHz and room temperature, the remanent polarization Pr were found to be 65, 92, and 106 μC/cm2 for the [001], [110] and [111]-oriented films, respectively. While the largest saturated magnetic moment Ms was along [001] direction with the value of ~ 12.8 emu/cm3. Anisotropic dielectric behaviors were also observed in differently oriented BFOLM thin films.
Keywords :
X-ray diffraction; bismuth compounds; crystal orientation; dielectric polarisation; ferroelectric thin films; ferromagnetic materials; lanthanum; magnetic moments; magnetic thin films; manganese; multiferroics; pulsed laser deposition; transmission electron microscopy; (LaAlO3)0.3(Sr2AlTaO6)0.35; BiFeO3:La,Mn; CaRuO3-(LaAlO3)0.3(Sr2AlTaO6)0.35; HRTEM; La modified BFO thin film; Mn modified BFO thin film; X-ray diffraction; XRD; [001] direction; [001] single crystal substrate; [001]-oriented film; [110] single crystal substrate; [110]-oriented film; [111] single crystal substrate; [111]-oriented film; anisotropic dielectric behaviors; crystallographic orientation; ferroelectric properties; ferromagnetic properties; heterostructures; high resolution transmission electron microscopy; highly epitaxial growth; multiferroic behaviors; orientation engineered BFOLM thin films; orientational dependence; oriented BFOLM thin films; pulsed laser deposition; remanent polarization; saturated magnetic moment; Epitaxial growth; Lead; Magnetic films; BiFeO3; crystallographic orientation; multiferroic; pulsed laser deposition; thin films;
Conference_Titel :
Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1162-6
Electronic_ISBN :
978-1-4577-1161-9
DOI :
10.1109/ISAF.2011.6014130
