DocumentCode :
3229591
Title :
Formation of cylindrical profile of Si by KrF excimer laser system for optical interconnect
Author :
Hung, Shih-Che ; Shiu, Shu-Chia ; Chao, Jiun-Jie ; Lin, Ching-Fuh
Author_Institution :
Grad. Inst. of Photonics & Optoelectron., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2011
fDate :
15-18 Aug. 2011
Firstpage :
5
Lastpage :
8
Abstract :
A technique applying the homogenized KrF excimer laser reformation to fabricate Si cylindrical profile is presented. High-power excimer laser was used to illuminate high-aspect-ratio Si ridges which were fabricated using typical lithography and etching process. The Si ridges were then melted and reshaped to cylinders due to surface tension. The structure can be further preceded by thermal oxidation to produce wave guiding photonics. It is capable of fabricating sub-micrometer Si waveguides with extremely smooth surface.
Keywords :
elemental semiconductors; excimer lasers; laser beam etching; lithography; melting; optical fabrication; optical interconnections; optical waveguides; oxidation; ridge waveguides; silicon; surface tension; Si; cylinders reshaping; cylindrical profile formation; etching process; guiding photonics; high-aspect-ratio ridges; high-power excimer laser; homogenized KrF excimer laser reformation; lithography; melting process; optical interconnect; smooth surface; submicrometer waveguides fabrication; surface tension; thermal oxidation; CMOS integrated circuits; Educational institutions; Lasers; Optical waveguides; Oxidation; Photonics; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
ISSN :
1944-9399
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2011.6144570
Filename :
6144570
Link To Document :
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