DocumentCode :
3229864
Title :
Towards realistic atomic-scale modeling of nanoscale devices
Author :
Blom, Anders ; Stokbro, Kurt
Author_Institution :
QuantumWise A/S, Copenhagen, Denmark
fYear :
2011
fDate :
15-18 Aug. 2011
Firstpage :
1487
Lastpage :
1492
Abstract :
On the nanoscale, electrical currents behave radically different compared to on the microscale. As the active regions become comparable to or smaller than the mean-free path of the material, it becomes necessary to describe the electron transport by quantum-mechanical methods instead of using classical relations like Ohm´s law. Over the past decade, methods for computing electron tunneling currents in nanosized junctions have evolved steadily, and are now approaching a sophistication where they can provide real assistance in the development of novel semiconductor materials and devices. At the same time, the industry´s demand for such solutions is rising rapidly to meet the challenges both above and under the 16 nm node. In this paper we provide an overview of the current state-of-the-art of the field of how to model electrical currents on the nanoscale, using atomic-scale simulations.
Keywords :
electron mobility; nanoelectronics; semiconductor device models; technology CAD (electronics); tunnelling; active regions; atomic-scale modeling; atomic-scale simulation; electron transport; electron tunneling current; nanoscale devices; nanoscale electrical currents; nanosized junctions; quantum-mechanical method; semiconductor device; semiconductor materials; Boundary conditions; Computational modeling; Electric potential; Electrodes; Logic gates; Materials; Tunneling; Nanoelectronics; atomic-scale simulations; multi-scale; phonons; transport;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
ISSN :
1944-9399
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2011.6144584
Filename :
6144584
Link To Document :
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