DocumentCode :
3229954
Title :
Analysis of partial discharges in a capacitor-type structure
Author :
Gosse, B. ; Hammal, R. ; Sassoulas, P.O. ; Gosse, J.-P.
Author_Institution :
Univ. Joseph Fourier, Grenoble, France
Volume :
2
fYear :
1996
fDate :
20-23 Oct 1996
Firstpage :
510
Abstract :
Partial discharges in a capacitor-type structure have been registered with a digital discharge analyzer for increasing voltages up to breakdown. The capacitor contained two 13.6 μm thick PP films pressed between two plane electrodes. The discharges were located by FTIR mapping at the edge of the electrodes. At high applied voltages, electrochemiluminescence and discharges give light emission, the first phenomenon being predominant. The variations with time of the light emitted by the discharges have been correlated with the phase-distributions of their number and charge
Keywords :
capacitors; chemiluminescence; electroluminescence; partial discharges; polymer films; FTIR mapping; PP film; breakdown; capacitor; digital discharge analyzer; electrochemiluminescence; light emission; partial discharge; phase distribution; plane electrode; Breakdown voltage; Capacitors; Degradation; Electrodes; Fault location; Frequency; Optical films; Partial discharges; Photomultipliers; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location :
Millbrae, CA
Print_ISBN :
0-7803-3580-5
Type :
conf
DOI :
10.1109/CEIDP.1996.564521
Filename :
564521
Link To Document :
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