DocumentCode :
3230122
Title :
Low-noise readout circuits with a response time acceleration technique for high output impedance sensors
Author :
Mars, Kamel ; Kawahito, Shoji
Author_Institution :
Grad. Sch. of Sci. & Technol., Shizuoka Univ., Hamamatsu, Japan
fYear :
2010
fDate :
6-9 Dec. 2010
Firstpage :
1159
Lastpage :
1162
Abstract :
In this paper, a low-noise high-gain read-out circuit with a response time acceleration technique for high output impedance sensors is presented. In the readout circuits using a switched capacitor amplifier, the thermal noise can be greatly reduced if a reset noise component sampled at the charge summing node is canceled. Due to high output impedance of sensors the response time is large to achieve the low noise requirement. A new technique for response time acceleration is presented making the circuit response time faster white keeping the noise level unaffected.
Keywords :
amplifiers; image sensors; infrared detectors; readout electronics; thermal noise; thermopiles; high output impedance sensors; low-noise high-gain read-out circuit; response time acceleration technique; switched capacitor amplifier; thermal noise; thermopile infrared image sensors; Acceleration; CMOS integrated circuits; CMOS technology; Noise; Sensors; Strontium; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-7454-7
Type :
conf
DOI :
10.1109/APCCAS.2010.5774931
Filename :
5774931
Link To Document :
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