DocumentCode :
3230258
Title :
Comparative material issues for fast reliable switching in STT-RAMs
Author :
Munira, Kamaram ; Soffa, William A. ; Ghosh, Avik W.
Author_Institution :
Charles L. Brown Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
fYear :
2011
fDate :
15-18 Aug. 2011
Firstpage :
1403
Lastpage :
1408
Abstract :
With its fast write and read, small cell size, non-volatility and excellent endurance, Spin Transfer Torque-RAM (STT-RAM) has a high potential of dominating the embedded and standalone memory world in the near future. In this paper, the suitability of different classes of magnetic materials constituting the STT-RAM free layer is reviewed for faster switching and thermal stability. We identify the following material classes for faster switching in the thermally stable free-layer of a STT-RAM: (a) In-plane materials with high HK and low MS. While the high HK deters the magnetization during the easy to hard axis switching, it helps with switching past the equator, making the switching speeds for high and low HK materials comparable. However, high HK materials benefit from higher thermal stability. (b) Perpendicular materials with low damping have the same switching speed as in-plane materials but greater switching probability because of a lower critical current. The demagnetization field helps the free layer to start switching to the hard axis, but hinders it from switching further to the easy axis beyond the equator. (c) Anti-ferromagnetically capped partially-perpendicular materials. Capping with a Va layer decreases the demagnetization field, which promotes faster switching.
Keywords :
magnetic materials; magnetic switching; magnetic tunnelling; magnetisation; random-access storage; thermal stability; torque; STT-RAM; comparative material issues; magnetic materials; magnetization; perpendicular materials; reliable switching; spin transfer torque-RAM; thermal stability; Conferences; Magnetomechanical effects; Materials; Perpendicular magnetic anisotropy; Random access memory; Switches; Spin transfer torque random access memory (STT-RAM); magnetic tunnel junction; spin torque; spin transfer switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
ISSN :
1944-9399
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2011.6144606
Filename :
6144606
Link To Document :
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