• DocumentCode
    3230746
  • Title

    Optical fiber sensors

  • Author

    Murphy, K.A. ; Gunther, M.F. ; Elster, J.L. ; Alcock, M.A.

  • Author_Institution
    Fiber & Electro-Opt. Res. Center, Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    30 Oct-2 Nov 1995
  • Firstpage
    380
  • Abstract
    The results of high temperature fatigue tests are introduced. Fiber optic strain sensors, specifically designed for high temperature environments, were used to monitor strain on stainless steel specimens at elevated temperatures up to 2460°F (1349°C). The fatigue loading test results presented here were conducted by the Fiber and Electro-Optics Research Center (FEORC) in coordination with Wright Laboratories, Materials Directorate. The strain, resulting from fatigue loading at high temperature, was monitored through the application and operation of short gauge length, low finesse, extrinsic Fabry-Perot interferometric (EFPI) optical fiber strain gauges constructed with metal coated silica-based fibers
  • Keywords
    Fabry-Perot interferometers; fatigue; fatigue testing; fibre optic sensors; high-temperature techniques; stainless steel; strain gauges; strain measurement; strain sensors; 1349 C; 2460 F; Fiber and Electro-Optics Research Center; Materials Directorate; NiCrCo; Wright Laboratories; elevated temperatures; extrinsic Fabry-Perot interferometric optical fiber strain gauges; fatigue loading; fatigue loading test results; fiber optic strain sensors; high temperature environments; high temperature fatigue tests; low finesse; metal coated silica-based fibers; optical fiber sensors; short gauge length; stainless steel specimens; strain measurement; strain monitoring; Capacitive sensors; Fatigue; Materials testing; Monitoring; Optical design; Optical fiber sensors; Optical fiber testing; Optical fibers; Steel; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2450-1
  • Type

    conf

  • DOI
    10.1109/LEOS.1995.484762
  • Filename
    484762