Title :
Structured CsI(Tl) scintillators for X-ray imaging applications
Author :
Nagarkar, V.V. ; Gupta, T.K. ; Miller, S. ; Klugarman, Y. ; Squillante, M.R. ; Entine, G.
Author_Institution :
Radiat. Monitoring Devices Inc., Watertown, MA, USA
Abstract :
We are developing large-area, thick, structured CsI(Tl) imaging sensors for a wide variety of X-ray imaging applications. Recently we have fabricated structured CsI(Tl) scintillators ranging from 30 μm (16 mg/cm2) to 2000 μm (900 mg/cm2) in thickness and up to 15×15 cm2 in area. Even 2000-μm-thick film showed well-controlled columnar growth throughout the film. Material characterization confirmed that the film is crystalline in nature and that the stoichiometry is preserved. To improve the spatial resolution of thick films, post-deposition treatments were performed. The effect of these treatments on film characteristics was quantitatively evaluated by measuring signal output, modulation transfer function [MTF(f)], noise power spectrum [NPS(f)], and detective quantum efficiency [DQE(f)]. The data show that by proper film treatments, the film DQE(f) can be improved
Keywords :
X-ray imaging; optical transfer function; position sensitive particle detectors; solid scintillation detectors; stoichiometry; thick film devices; 2000 mum; 30 mum; CsI:Tl; X-ray imaging; columnar growth; detective quantum efficiency; large-area; modulation transfer function; noise power spectrum; post-deposition treatment; signal output; spatial resolution; stoichiometry; structured CsI(Tl) imaging sensors; structured CsI(Tl) scintillators; thick films; Crystalline materials; Crystallization; Image sensors; Noise measurement; Optical imaging; Power measurement; Spatial resolution; Thick films; Transfer functions; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium, 1997. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7803-4258-5
DOI :
10.1109/NSSMIC.1997.672574
