• DocumentCode
    323185
  • Title

    TGLD: a 16 channel charge readout chip for the PHENIX Pad Chamber detector subsystem at RHIC

  • Author

    Bryan, W.L. ; Jagadish, U. ; Britton, C.L. ; Frank, S.S., Jr. ; Ericson, M.N. ; Simpson, M.L. ; Young, G.R. ; Clonts, L.G. ; Smith, R.S. ; Oskarsson, Anders ; Mark, Tommy ; Obrien, Ed ; Greene, Vicki

  • Author_Institution
    Oak Ridge Nat. Lab., TN, USA
  • fYear
    1997
  • fDate
    9-15 Nov 1997
  • Firstpage
    236
  • Abstract
    This paper describes the PHENIX Pad Chamber (PC) subsystem charge readout chip, TGLD. Due to the PC´s high channel density, the TGLD and associated circuitry operate within the active detector region as permanent, zero access components during PHENIX operation and implement remote set-up, test and operation. Since the PC detector consists of three subassemblies (PC1, PC2 and PC3) that detect particles at three different distances from the PHENIX collision vertex, the TGLD design accommodates varying pad capacitance and charge gain for PC1, PC2 and PC3 and provides adjustable discrimination thresholds from MIP/10 to 2 MIP (minimum ionizing particle). Operation with a complimentary digital memory unit (DMU) to form low power, low mass, readout cards is described. Partitioning of readout electronics and address control for robust PC operation are discussed. Component and system test results are reported
  • Keywords
    CMOS integrated circuits; differentiating circuits; digital readout; discriminators; mixed analogue-digital integrated circuits; nuclear electronics; preamplifiers; 16 channel; PC1; PC2; PC3; PHENIX Pad Chamber; TGLD; address control; charge gain; charge readout chip; digital memory unit; discrimination thresholds; minimum ionizing particle; pad capacitance; readout electronics; Atherosclerosis; Capacitance; Circuit testing; Detectors; Laboratories; Particle tracking; Readout electronics; Robust control; Switches; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1997. IEEE
  • Conference_Location
    Albuquerque, NM
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-4258-5
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1997.672576
  • Filename
    672576