Title :
Statistical leakage power modelling of manufacturing process variations at system level
Author :
Chenxi Ni ; Al Tarawneh, Z. ; Russell, G. ; Bystrov, Alex
Author_Institution :
MSD Group, Newcastle Univ., Newcastle upon Tyne, UK
Abstract :
Process variation has become a major issue in system performance estimation as the technology feature size continues to decrease. This paper proposes a statistical methodology to bring the process variation effects from process level up to system level in terms of circuit leakage power dissipation. A cell library has been built which offers a rapid analysis of process variation effects on system leakage power performance. As a demonstration vehicle for this technique, the leakage power distribution of a micropipeline circuit has been simulated using this cell library. The experimental results show that the proposed method is much faster than the traditional statistical power analysis (SPA) approach by a factor of 150; the results are also compared with Monte Carlo simulation data for validation purposes, and show an acceptable error rate of within 5% and in most cases less than 3%.
Keywords :
Monte Carlo methods; manufacturing processes; statistical analysis; Monte Carlo simulation data; cell library; circuit leakage power dissipation; error rate; leakage power distribution; manufacturing process variations; micropipeline circuit; statistical leakage power modelling; statistical methodology; statistical power analysis; system leakage power performance; system level; system performance estimation; Analytical models; Integrated circuit modeling; Libraries; Logic gates; MOS devices; Mathematical model; Semiconductor process modeling; leakage power; process variation; systeme level modelling;
Conference_Titel :
Power Engineering and Automation Conference (PEAM), 2012 IEEE
Conference_Location :
Wuhan
Print_ISBN :
978-1-4577-1599-0
DOI :
10.1109/PEAM.2012.6612432