Title :
Performance evaluation of GaAs based MODFETs
Author :
Kohn, E. ; Lepore, A. ; Lee, H. ; Levy, M.
Author_Institution :
Siemens Corp. Res., Princeton, NJ, USA
Abstract :
Three key aspects of AlGaAs/InGaAs/GaAs MODFETs, namely current-handling capability, signal delay, and saturated output regime, are experimentally evaluated and correlated with the heterostructure configuration. Gate lengths down to 0.1 μm and corresponding cutoff frequencies above 140 GHz are employed. The three aspects are found to be closely interrelated. By the incorporation of an InGaAs quantum well the two-dimensional-electron-gas (2DEG) density of the materials system can be considerably extended. However, this results in only limited improvement for the FET current-handling capability above a 2DEG density of 2×1012 cm-2. The main effect on the MODFET current gain cutoff frequency is through the reduction of the input delay as demonstrated with 0.1-μm-gate-length devices. Extracting the same intrinsic delay time means that the electron dynamics in the channel of AlGaAs/GaAs and pseudomorphic MODFETs is very comparable. This is consistent with the fact that there is no significant change in the effective electron mass, although changes in the intervalley scattering dynamics are still expected. Open-circuit voltage gain and output conductance are strongly related to the space-charge-layer configuration on top of the channel. This is related to the recess configuration; however, for a large voltage gain a high structural aspect ratio is generally needed
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor device testing; 0.1 micron; 140 GHz; 2DEG density; AlGaAs-InGaAs-GaAs; InGaAs quantum well; MODFETs; current gain cutoff frequency; current-handling capability; cutoff frequencies; effective electron mass; electron dynamics; gate length; heterostructure configuration; intervalley scattering dynamics; open circuit voltage gain; output conductance; recess configuration; saturated output regime; signal delay; space-charge-layer configuration; structural aspect ratio; Cutoff frequency; Delay effects; Electrons; FETs; Gallium arsenide; HEMTs; Indium gallium arsenide; MODFETs; Particle scattering; Voltage;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1989. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY
DOI :
10.1109/CORNEL.1989.79825