Title :
MSAG-Lite: GaAs IC process technology addressing defense conversion
Author :
Lindberg, C.E. ; Fisher, D.G.
Author_Institution :
ITT Gallium Arsenide Technol. Center, Roanoke, VA, USA
Abstract :
In the mid 1980´s the ITT Gallium Arsenide Technology Center (ITT GTC) developed a planar GaAs IC process based on ion implanted self aligned gate (SAG) FETs specifically for military applications. With only one additional implant mask for each device type, high speed enhancement/depletion (E/D) digital, low noise microwave and high efficiency power microwave FETs could be fabricated on a single chip. Hence, the process was denoted Multifunction Self-Aligned Gate or MSAG. Recognizing the growing importance of commercial applications, ITT GTC launched a major effort in 1989 to tailor the MSAG process for low frequency (<6 GHz) applications, by simplifying the process and lowering the costs associated with wafer fabrication and cycle time. This effort brought about the MSAG-Switch process and later, MSAG-Lite. This paper explains how the process conversion took place, the applications that were targeted, and the products that resulted.<>
Keywords :
UHF integrated circuits; field effect MMIC; gallium arsenide; integrated circuit technology; 6 GHz; GaAs; GaAs IC process technology; MSAG-Lite process; MSAG-Switch process; defense conversion; ion implanted SAG FETs; multifunction self-aligned gate; planar GaAs IC process; self aligned gate FETs; wafer fabrication; Application specific integrated circuits; Costs; Fabrication; Frequency; Gallium arsenide; Implants; Integrated circuit noise; Low-frequency noise; Microwave FET integrated circuits; Microwave devices;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406156