DocumentCode :
323294
Title :
Surface polish of GSO scintillator using chemical process
Author :
Kurashige, K. ; Kurata, Y. ; Ishibashi, H. ; Susa, K.
Author_Institution :
Tsukuba Res. Lab., Hitachi Chem. Co. Ltd., Ibaraki, Japan
fYear :
1997
fDate :
9-15 Nov 1997
Firstpage :
842
Abstract :
A Ce doped Gd2SiO5 (GSD) single crystal is an excellent scintillator featuring a large light output, a short decay constant and a high absorption coefficient. It was shown in our previous studies that the surfaces of the scintillator should be polished to get scintillation light output efficiently especially for long and narrow scintillators. Therefore, we newly developed a chemical process to polish the GSO crystal. The surface of the GSO crystal was found to become smooth when it was etched using anhydrous orthophosphoric acid at 150-300°C. The process was also proved to be applicable to large size crystal such as 20×20×200 mm3 preventing thermal shock crack. An improvement in the scintillator efficiency was confirmed using the chemical polishing process
Keywords :
cerium; gadolinium compounds; polishing; solid scintillation detectors; thermal shock; 150 to 300 C; GSO scintillator; Gd2SiO5:Ce; anhydrous orthophosphoric acid; chemical polishing process; chemical process; decay constant; scintillation light output; scintillator efficiency; thermal shock crack; Absorption; Chemical processes; Energy resolution; Etching; Nuclear physics; Positron emission tomography; Rough surfaces; Surface roughness; Testing; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1997. IEEE
Conference_Location :
Albuquerque, NM
ISSN :
1082-3654
Print_ISBN :
0-7803-4258-5
Type :
conf
DOI :
10.1109/NSSMIC.1997.672712
Filename :
672712
Link To Document :
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