DocumentCode :
3233163
Title :
Parameter extraction of SOILDMOS based on the HISIM-HV model
Author :
Tianle, Miao ; WenJun, Li ; Huang, Wang ; Xudan, Shentu ; Jun, Liu ; Lingling, Sun
Author_Institution :
Microelectron. CAD Center, Hangzhou Dianzi Univ., Hangzhou, China
fYear :
2010
fDate :
8-11 May 2010
Firstpage :
683
Lastpage :
686
Abstract :
As an RF power device, SOILDMOS has a huge market demand and broad development prospects. In this paper, we conduct extensive measurement of the SOILDMOS chip using the vector network analyzer, microwave probe station, semiconductor parameter analyzer. The measuring results are obtained with Agilent IC-CAP 2008. With these results, SOILDMOS can be modeled based on the HiSIM-HV model. The parameter extraction and curve fitting are carried out with the IC-CAP tool. The experimental results show that the parameters extracted based on the HiSIM-HV model perform well.
Keywords :
curve fitting; power MOSFET; semiconductor device models; silicon-on-insulator; Agilent IC-CAP 2008; HISIM-HV model; IC-CAP tool; RF power device; SOILDMOS; curve fitting; microwave probe station; parameter extraction; semiconductor parameter analyzer; vector network analyzer; MOS devices; MOSFET circuits; Parameter extraction; Power MOSFET; Radio frequency; Radiofrequency amplifiers; Semiconductor device measurement; Silicon; Soil measurements; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
Type :
conf
DOI :
10.1109/ICMMT.2010.5525025
Filename :
5525025
Link To Document :
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