DocumentCode :
3233436
Title :
Multiple time-domain diffraction of plane waves by an array of perfectly conducting wedges for UWB signals
Author :
Liu, Peng ; Guo, Jianyan ; Liu, Juhua ; Wang, Jianying ; Long, Yunliang
Author_Institution :
Dept. of Electron. & Commun. Eng., Sun Yat-sen Univ., Guangzhou, China
fYear :
2010
fDate :
8-11 May 2010
Firstpage :
1173
Lastpage :
1176
Abstract :
The time domain (TD) solution for multiple wedge diffraction case considering plane wave incidence is investigated. The proposed TD solution is based on the representation of the inverse Laplace transform of the corresponding frequency domain (FD) solution in closed form, as it is given by a hybrid of the uniform theory of diffraction (UTD)-physic optics (PO) solution. An algorithm to predict the TD diffracted field after an arbitrary number of perfectly conducting wedges having different interior angles is presented. The algorithm has the major advantage of saving the computation time over the existing formulation when the number of wedges is very large. The source is assumed to be above, bellow, or level with the wedge height. The proposed TD solution is validated with the numerical inverse fast Fourier transform of the FD solution.
Keywords :
Laplace transforms; electromagnetic wave diffraction; fast Fourier transforms; frequency-domain analysis; radiowave propagation; time-domain analysis; ultra wideband communication; UTD-physic optics; UWB signal; frequency domain solution; inverse Laplace transform; inverse fast Fourier transform; multiple time-domain diffraction; multiple wedge diffraction; plane wave incidence; uniform theory-of-diffraction; Bandwidth; Bellows; Fast Fourier transforms; Frequency domain analysis; Laplace equations; Optical diffraction; Physical theory of diffraction; Sun; Time domain analysis; Ultra wideband technology; radio propagation; time-frequency analysis; ultrawideband (UWB); uniform theory of diffraction (UTD);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
Type :
conf
DOI :
10.1109/ICMMT.2010.5525039
Filename :
5525039
Link To Document :
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