Title :
Flow Simulation: Advanced Dielectric Etch Equipment Design and Process Development
Author :
Bera, Kallol ; Carducci, Jim ; Hoffman, Daniel ; Ma, Shawming
Author_Institution :
Appl. Mater. Inc., Sunnyvale, CA
Abstract :
With shrinkage in device size, use of new materials in multiple layers, and larger wafer size, control of process uniformity across the wafer becomes crucial in semiconductor manufacturing. Flow simulation has been used to design advanced dielectric etch equipment to achieve better flow uniformity. The ability to tune flow uniformity helped us to achieve various desired process characteristics, such as CD bias, profile, and etch stop across the wafer
Keywords :
etching; flow simulation; semiconductor device manufacture; semiconductor device models; advanced dielectric etch equipment design; flow simulation; multiple layers; process development; semiconductor manufacturing; wafer; Dielectric devices; Dielectric materials; Etching; Plasma applications; Plasma simulation; Process control; Process design; Scanning electron microscopy; Semiconductor materials; Size control;
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2006 International Conference on
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0404-5
DOI :
10.1109/SISPAD.2006.282881