DocumentCode :
3234082
Title :
Effect of the nanocrystal formation on the properties of the electroless Ni-P deposit
Author :
Cheng, Y.H. ; Zou, Y. ; Cheng, L. ; Liu, W.
Author_Institution :
Inst. of Thermal Sci. & Technol., Shandong Univ., Jinan
fYear :
2008
fDate :
6-9 Jan. 2008
Firstpage :
489
Lastpage :
493
Abstract :
The deposits of electroless nickel-phosphorus fabricated in different process were studied by means of OM, XRD and DTA. Three different kinds of microstructure, such as nano-crystalline, amorphous and co-existence of both, could be obtained by adjusting the process. Moreover, the hardness of the deposit changed according to the different microstructure. The hardness of deposit had a great increasing when the whole matrix was almost nanocrystalline structure. DTA results also indicated that the formation of nanocrystalline phase could improve the thermal stability of deposit. This conclusion provided a good theoretical basis for this Ni-P deposit using for wear and corrosion resistances in the technology area of MEMS/NEMS.
Keywords :
X-ray diffraction; corrosion protective coatings; differential thermal analysis; electroless deposited coatings; micromechanical devices; nanostructured materials; nanotechnology; nickel alloys; optical microscopy; phosphorus alloys; thermal stability; wear resistant coatings; DTA; FeCJk; FeCJk - Surface; MEMS; NEMS; NiP; OM; XRD; amorphous phase; corrosion resistance; electroless nickel-phosphorus deposit; hardness; microstructure; nanocrystal; thermal stability; wear resistance; Corrosion; Crystallization; Heat treatment; Micromechanical devices; Microstructure; Nanocrystals; Nanoelectromechanical systems; Surface morphology; Temperature; X-ray scattering; electroless deposit; heat stability; microstructure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
Type :
conf
DOI :
10.1109/NEMS.2008.4484378
Filename :
4484378
Link To Document :
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