Title :
A microwave circuit electric field imager
Author :
Budka, T.P. ; Rebeiz, Gabriel M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
We report on the theory of operation and the experimental results obtained from an electric field imaging system that employs the method of modulated scattering. The system is low cost and is capable of mapping the normal and tangential electric field magnitude and electrical phase delay at each position within 5 /spl mu/m above a microwave circuit in the frequency range of 0.5 GHz to 18 GHz. The electric field probes are fabricated on a very thin quartz substrate. The measured images of the normal and tangential electric fields over microstrip and coplanar waveguide transmission lines are presented and agree well with theory.<>
Keywords :
MMIC; coplanar waveguides; electric field measurement; integrated circuit testing; microstrip circuits; microwave imaging; microwave measurement; modulation; 0.5 to 18 GHz; 5 micron; CPW transmission lines; coplanar waveguide; electric field imager; electric field probes; electrical phase delay; low cost system; microstrip transmission lines; microwave circuit field imaging; modulated scattering; normal electric field; quartz substrate; tangential electric field magnitude; Costs; Delay; Electric variables measurement; Frequency; Microstrip; Microwave circuits; Microwave imaging; Probes; Scattering; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406173
