• DocumentCode
    3234844
  • Title

    RF Synthetic instrumentation used to support EW test capability

  • Author

    Murrill, Jeff

  • Author_Institution
    Electron. Syst. Sector, Northrop Grumman Corp., Rolling Meadows, IL
  • fYear
    2008
  • fDate
    8-11 Sept. 2008
  • Firstpage
    144
  • Lastpage
    147
  • Abstract
    The Department of Defense (DoD) and other government agencies have started to require the use of RF synthetic instrumentation in new automated test system (ATS) architectures. However, the use of RF synthetic instrumentation in various forms has been in use for quite some time and has transformed the methods used for the testing of basic and complex electronic warfare (EW) systems. RF synthetic instrumentation is a modular system architecture consisting of functional COTS modules that are used to form traditional instruments and instrument functions. As EW system complexity increases and these systems become smaller and more integrated, the demands increase for the use of RF synthetic instruments. When compared to traditional rack and stack or stand-alone instruments, the RF synthetic instruments offer advantages in EW system test. RF synthetic instrument technology offers the capability to emulate many instrument types using different combinations of the COTS functional hardware modules. Some examples will be presented on RF synthetic instruments can be used to support EW system test. Using RF synthetic instruments provides the framework in the test system to adapt to changing test requirements and provides added flexibility to address new system test needs.
  • Keywords
    automatic test equipment; electronic warfare; COTS functional hardware modules; Department of Defense; EW test capability; RF synthetic instrumentation; automated test system architectures; electronic warfare systems; modular system architecture; Aerospace electronics; Algorithm design and analysis; Analog-digital conversion; Electronic equipment testing; Electronic warfare; Government; Instruments; Radio frequency; Signal processing algorithms; System testing; Electronic Warfare; RF; Synthetic Instrument; System Test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2008 IEEE
  • Conference_Location
    Salt Lake Cirty, UT
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-2225-8
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2008.4662601
  • Filename
    4662601