Title :
An alternative way of computing S-parameters via impulsive TLM analysis without using absorbing boundary conditions
Author :
Righi, M. ; Eswarappa, C. ; Hoefer, Wolfgang J. R. ; Russer, Peter
Author_Institution :
Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
Abstract :
This paper presents a transmission line matrix (TLM) procedure to compute wideband scattering parameters of microwave structures from a single time domain simulation without using matched loads or absorbing boundary conditions (ABCs) in the main propagating direction. This is done by computing the admittance parameters in the time domain through an impulsive excitation and short-circuit boundary conditions (SBCs). Results presented for both lossy and lossless cases agree well with available data. Also, this procedure does not require the prior knowledge of the propagation characteristics (such as incidence angle or effective dielectric constant) of the guide.<>
Keywords :
S-parameters; electric admittance; microwave devices; time-domain analysis; transmission line matrix methods; waveguide components; S-parameters; admittance parameters; impulsive TLM analysis; microwave structures; short-circuit boundary conditions; time domain simulation; transmission line matrix method; wideband scattering parameters; Admittance; Boundary conditions; Circuits; Finite difference methods; Radio frequency; Scattering parameters; Time domain analysis; Transmission line matrix methods; Voltage; Wideband;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406187