Title :
Pulsed electric field treatment of saccharomyces cerevisiae using different waveforms
Author :
Qin, S. ; Timoshkin, I.V. ; Maclean, M. ; Wilson, M.P. ; Given, M.J. ; Wang, T. ; Anderson, J.G. ; Macgregor, S.J.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Strathclyde, Glasgow, UK
Abstract :
Pulsed electric field (PEF) treatment can be used for non-thermal inactivation of microorganisms. The aim of this paper is to investigate PEF treatment of yeast, Saccharomyces cerevisiae, using three different field waveforms: square; non-oscillating exponential and oscillating exponential. The PEF system used in this paper consists of a pulsed power supply and a parallel-plane metallic electrodes treatment cell located in an air-pressurised chamber. PEF treatment of the yeast was conducted using electric field impulses with magnitudes of 67 kV/cm and 80 kV/cm. The efficacy of the PEF treatment for inactivation of the yeast cells was assessed by comparison of the PEFtreated and untreated yeast populations. Results showed that ~3-log10 reduction in the yeast population can be achieved with 100 impulses using all tested waveforms. Amongst all three tested waveforms non-oscillating exponential impulses demonstrated improved PEF performance. The effect of duration of treatment and peak magnitude of the field on the PEF process is discussed.
Keywords :
bioelectric phenomena; biological effects of fields; cellular biophysics; microorganisms; oscillations; waveform analysis; Saccharomyces cerevisiae; air-pressurised chamber; microorganisms; nonoscillating exponential; nonthermal inactivation; oscillating exponential; parallel-plane metallic electrodes treatment cell; pulsed electric field treatment; pulsed power supply; square exponential; waveforms; yeast cells; yeast population; Conductivity; Electric fields; Electrodes; Microorganisms; Sociology; Statistics; Suspensions; Pulsed electric field; Saccharomyces cerevisiae; field waveforms; inactivation; yeast;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2015.005152