DocumentCode :
3235451
Title :
Invariant pattern recognition using ring-projection and dual-tree complex wavelets
Author :
Chen, Guang-yi ; Xie, Wen-Fang
Author_Institution :
Dept. of Mech. & Ind. Eng., Concordia Univ., Montreal, QC, Canada
fYear :
2011
fDate :
10-13 July 2011
Firstpage :
182
Lastpage :
186
Abstract :
A novel descriptor is proposed for invariant pattern recognition by using ring-projection and dual-tree complex wavelets. The ring-projection takes the summation of all pixels that lie on the circle with radius r and centre at the centroid of the pattern. This transforms the pattern from a 2-D image to a 1-D signal, so less memory is needed and it is faster than existing 2-D descriptors in the recognition process. Dual-tree complex wavelet transform is applied to the ring-projection since it has the approximate shift-invariant property, which is very important in pattern recognition. Experimental results show that the proposed descriptor in this paper is a feasible choice for invariant pattern recognition.
Keywords :
optical character recognition; trees (mathematics); wavelet transforms; 2-D descriptors; approximate shift-invariant property; dual-tree complex wavelets; invariant pattern recognition; pattern transforms; ring-projection; wavelet transform; Databases; Feature extraction; Fourier transforms; Pattern recognition; Wavelet analysis; Wavelet transforms; Gaussian white noise; Wavelet transform; dual-tree complex wavelets; invariant features; optical character recognition (OCR); pattern recognition; ring-projection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wavelet Analysis and Pattern Recognition (ICWAPR), 2011 International Conference on
Conference_Location :
Guilin
ISSN :
2158-5695
Print_ISBN :
978-1-4577-0283-9
Type :
conf
DOI :
10.1109/ICWAPR.2011.6014459
Filename :
6014459
Link To Document :
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