DocumentCode :
3235541
Title :
Variational Compact Modeling and Simulation for Linear Dynamic Systems
Author :
Fan, Jeffrey ; Mi, Ning ; Tan, Sheldon X D
Author_Institution :
Dept. of Electr. Eng., California Univ., Riverside, CA
fYear :
2006
fDate :
14-15 Sept. 2006
Firstpage :
17
Lastpage :
22
Abstract :
In this paper, we propose a new statistical model order reduction technique called SSMOR method, that is suitable for considering both intra-die and inter-die process variations. The SSMOR generates order reduced variational models from the original variational circuits. The reduced model can be used for fast statistical performance analysis of interconnect circuits with variational power sources. The SSMOR uses statistical spectrum method to compute the variational moments and Monte Carlo sampling method via modified Krylov subspace reduction method to generate the variational reduced models. Experimental results show that explicit moment matching is not suitable for variational analysis and Krylov subspace projection method is more reliable. The proposed method can deliver about 100times speedup over the pure Monte Carlo based projection-based reduction method with less than 1 % of errors for both means and variances in statistical transient analysis
Keywords :
Monte Carlo methods; circuit simulation; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; reduced order systems; sampling methods; Krylov subspace reduction method; Monte Carlo sampling; SSMOR method; inter-die process variation; interconnect circuit; intra-die process variation; linear dynamic system; statistical model order reduction technique; statistical performance analysis; statistical spectrum method; statistical transient analysis; variational circuit compact modeling; variational compact simulation; variational moment matching; Arithmetic; Circuit optimization; Circuit simulation; Computational modeling; Costs; Integrated circuit interconnections; Monte Carlo methods; Polynomials; RLC circuits; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Behavioral Modeling and Simulation Workshop, Proceedings of the 2006 IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9742-8
Type :
conf
DOI :
10.1109/BMAS.2006.283463
Filename :
4062045
Link To Document :
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