Title :
A practical noise parameter measurement method of packaged Low noise transistor
Author :
Liu, Di ; Zhou, Wei ; Wang, Yudong ; Fu, Jun ; Li, Gaoqing ; Cui, Jie
Author_Institution :
Agilent Technol., Beijing, China
Abstract :
The key issue of packaged Low noise transistor noise parameter characterization is test fixture, this paper describes how to design test fixture and TRL cal standard based on PCB in detail, and also comprehensive verification of test fixture and TRL cal standard in frequency domain and time domain. What´s more, this paper takes advantage of a new ultra-fast noise parameter measurement method with more simplicity, less test time and also more measurement accuracy.
Keywords :
frequency-domain analysis; measurement systems; time-domain analysis; transistors; PCB; TRL cal standard; frequency domain; noise parameter measurement method; package low noise transistor; test fixture; time domain; Fixtures; Impedance measurement; Noise figure; Noise measurement; Optimized production technology; Packaging; Phase noise; Signal processing; Testing; Time measurement; Low Noise Transistor; Noise Figure; Noise Parameter; TRL; Vector Network Analyzer;
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
DOI :
10.1109/ICMMT.2010.5525158
