DocumentCode :
3236326
Title :
A modified EMI noise source impedance modeling by employing two resistances calibration and Levenberg-Marquardt´s method
Author :
Yan Wei ; Yan, Wei ; Lu Xiao-quan ; Dong Ying-hua ; Wen, Feng
Author_Institution :
Sch. of Electr. & Autom. Eng., Nanjing Normal Univ., Nanjing, China
fYear :
2010
fDate :
8-11 May 2010
Firstpage :
2021
Lastpage :
2024
Abstract :
In order to design a effective EMI filter, noise source impedance (complex impedance) is very crucial, but actually, the result is low accuracy and no phase by employing traditional approaches. In the paper, a modified EMI noise source impedance modeling is proposed to investigate the characterization of EMI source impedance. The test shows that suggested method is more accurate and effective. Moreover, both amplitude and phase can be obtained.
Keywords :
electric impedance; electromagnetic interference; filters; EMI filter; EMI noise source impedance modeling; Levenberg-Marquardt method; resistance calibration; Calibration; Decision support systems; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Filters; Impedance; Phase noise; Testing; Zirconium; Electromagnetic compatibility; Electromagnetic interference; Levenberg-Marquardt´s method; Noise source impedance modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
Type :
conf
DOI :
10.1109/ICMMT.2010.5525177
Filename :
5525177
Link To Document :
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