Low temperature characterization of ceramic and film power capacitors

Author

Hammoud, Ahmad ; Overton, Eric

Author_Institution

NASA Lewis Res. Center, Cleveland, OH, USA

Volume

2

fYear

1996

fDate

20-23 Oct 1996

Firstpage

701

Abstract

Among the key requirements for advanced electronic systems is the ability to withstand harsh environments while maintaining reliable and efficient operation. Efforts were taken to design and develop power capacitors capable of wide temperature operation. Ceramic and film power capacitors were developed and characterized as a function of temperature from 20°C to -185°C in terms of their dielectric properties. These properties included capacitance stability and dielectric loss in the frequency range of 50 Hz to 100 kHz. DC leakage current measurements were also performed on the capacitors. The paper presents the results that indicate good operational characteristic behavior and stability of the components tested at low temperatures

Keywords

capacitance; ceramic capacitors; dielectric losses; electron device testing; leakage currents; low-temperature techniques; power capacitors; 20 to -185 C; 50 Hz to 100 kHz; DC leakage current measurements; capacitance stability; ceramic power capacitors; dielectric loss; dielectric properties; film power capacitors; low temperature characterization; operational characteristic behavior; reliable operation; wide temperature operation; Capacitance; Ceramics; Dielectric losses; Frequency; Leakage current; Maintenance; Power capacitors; Power system reliability; Stability; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on

Conference_Location

Millbrae, CA

Print_ISBN

0-7803-3580-5

Type

conf

DOI

10.1109/CEIDP.1996.564568

Filename

564568