Title :
Design, Automation and Test in Europe [Title page]
Abstract :
The following topics were dealt with: system specification; system modeling; MPSoC; system design methods; system synthesis; system optimisation; low power systems; formal verification; network on chip; microarchitectural design; architectural synthesis; reconfigurable computing; logic synthesis; technology dependent synthesis; deep-submicron circuits; physical design; analogue and mixed A/D systems; CAD; interconnect modelling; EMC; packaging; signal processing; wireless communication; secure and security systems; space and avionics systems; MEMS; sensor systems; multi-core platforms; mixed signal systems; industrial test; design for test; BIST; test generation; on-line testing; compilers; code generation; embedded systems and automotive electronics.
Keywords :
automotive electronics; avionics; circuit CAD; design for testability; electromagnetic compatibility; embedded systems; formal verification; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; logic design; micromechanical devices; network-on-chip; program compilers; radiocommunication; reconfigurable architectures; signal processing; space vehicle electronics; system-on-chip; BIST; CAD; EMC; MEMS; MPSoC; analogue systems; architectural synthesis; automotive electronics; avionics systems; code generation; compilers; deep-submicron circuits; design-for-test; embedded systems; formal verification; industrial test; interconnect modelling; logic synthesis; low power systems; microarchitectural design; mixed A-D systems; mixed signal systems; multicore platforms; network-on-chip; on-line testing; packaging; physical design; reconfigurable computing; security systems; sensor systems; signal processing; system design methods; system modeling; system optimisation; system specification; system synthesis; technology dependent synthesis; test generation; wireless communication;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
DOI :
10.1109/DATE.2008.4484626
