Abstract :
Presents the introductory welcome message from the conference proceedings.
Keywords :
Automatic testing; Automotive engineering; Circuit testing; Design automation; Electronic design automation and methodology; Embedded software; Embedded system; Integrated circuit testing; Software testing; System testing;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
DOI :
10.1109/DATE.2008.4484634