Title :
A Generalized Approach for Automatic Test Pattern Generation
Author :
Raina, Rajesh ; Rajashekhara, T.N.
Author_Institution :
Dept. of Electrical Engineering, Duke University, NC
Keywords :
Algorithm design and analysis; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Dictionaries; Libraries; Switches; Test pattern generators;
Conference_Titel :
Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
DOI :
10.1109/STIER.1987.716387
