• DocumentCode
    3238733
  • Title

    Investigation of effects of heat sinks on thermal performance of microelectronic package

  • Author

    Ekpu, Mathias ; Bhatti, Raj ; Ekere, Ndy ; Mallik, Sabuj ; Amalu, Emeka ; Otiaba, Kenny

  • Author_Institution
    Manuf. Eng. Res. Group, Univ. of Greenwich at Medway, Chatham, UK
  • fYear
    2011
  • fDate
    24-26 Nov. 2011
  • Firstpage
    127
  • Lastpage
    132
  • Abstract
    The concern about thermal performance of microelectronics is on the increase due to recent over-heating induced failures which have led to product recalls. Removal of excess heat from microelectronic systems with the use of heat sinks could improve thermal efficiency of the system. This paper investigates the effect of change in heat sink geometry on thermal performance of aluminium and copper heat sinks in microelectronics. Numerical studies on thermal conduction through an electronic package comprising a heat sink, chip, and thermal interface material were carried out. The thickness of the heat sink base and the height of the heat sink fins were varied in the study. The minimum and maximum temperatures of aluminium and copper heat sinks in the two models were investigated using steady state thermal conduction analysis. Better heat dissipation occurred in thinner base thickness and extended fins height for both aluminium and copper heat sinks. Aluminium heat sink recorded the lowest minimum temperatures in both investigations and is recommended as optimal thermal management material for heat sink production.
  • Keywords
    aluminium; cooling; copper; heat conduction; heat sinks; integrated circuit packaging; thermal management (packaging); Al; Cu; chip; heat dissipation; heat sink geometry; heat sinks effects; microelectronic package; microelectronic systems; over-heating induced failures; steady state thermal conduction analysis; thermal interface material; thermal management material; Aluminum; Copper; Electronic packaging thermal management; Heat sinks; Materials; Thermal analysis; Thermal conductivity; Electronic package; heat sink; microelectronics; temperature; thermal performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Adaptive Science and Technology (ICAST), 2011 3rd IEEE International Conference
  • Conference_Location
    Abuja
  • Print_ISBN
    978-1-4673-0758-1
  • Type

    conf

  • DOI
    10.1109/ICASTech.2011.6145164
  • Filename
    6145164