Title :
Scaling laws and performance limitations of power turn-off devices
Author :
Jaecklin, André A. ; Adam, Bruno
Author_Institution :
Asea Brown Boveri Ltd., Lenzberg, Switzerland
Abstract :
The performance of multiple-cell devices is limited by a redistribution of current during turn-off because minor differences between the otherwise identical cells seem to become important. A simple model based on Gaussian statistics gives a quantitative explanation of this phenomenon for the first time. For the example of a gate turn-off thyristor (GTO) it leads to an approximate square-root scaling of turn-off current with device size. Good agreement with experimental results is found. The model is not GTO-specific and may cover other devices as well
Keywords :
thyristors; GTO; Gaussian statistics; gate turn-off thyristor; performance limitations; scaling laws; Charge carrier lifetime; Circuits; Electric breakdown; Low voltage; Performance analysis; Physics; Silicon; Statistical distributions; Statistics;
Conference_Titel :
Power Electronics Specialists Conference, 1989. PESC '89 Record., 20th Annual IEEE
Conference_Location :
Milwaukee, WI
DOI :
10.1109/PESC.1989.48507