DocumentCode
3239253
Title
Towards fault tolerant parallel prefix adders in nanoelectronic systems
Author
Rao, Wenjing ; Orailoglu, Alex
Author_Institution
Dept. of CSE, UC San Diego, La Jolla, CA
fYear
2008
fDate
10-14 March 2008
Firstpage
360
Lastpage
365
Abstract
Future nanoelectronics based arithmetic components will enjoy abundant hardware, yet at the same time confront severe unreliability challenges. We focus on the fault tolerance of high performance parallel prefix adders (PPA), and exploit the inherent redundancy in PPAs to develop efficient fault tolerance approaches. We show that the internal invariant inherent in the parallel prefix adders provides support for online fault detection and fault masking. Furthermore, based on the particular regular structure of PPAs, an online diagnosis scheme can be developed, thus enabling the application of reconfigurability of nanoelectronics for the highly flexible online repair approaches. In contrast to traditional fault tolerance techniques that rely solely on significant external overhead, the proposed approach opens up a new genre of efficient fault tolerance techniques for arithmetic components in the nanoelectronic environment.
Keywords
adders; fault diagnosis; fault tolerance; nanoelectronics; redundancy; PPA redundancy; fault masking; fault tolerant parallel prefix adders; nanoelectronic based arithmetic components; online fault detection; Arithmetic; Crosstalk; Fabrication; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Nanoscale devices; Quantum cellular automata; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location
Munich
Print_ISBN
978-3-9810801-3-1
Electronic_ISBN
978-3-9810801-4-8
Type
conf
DOI
10.1109/DATE.2008.4484706
Filename
4484706
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