DocumentCode
3239379
Title
Coarse-Grain MTCMOS Sleep Transistor Sizing Using Delay Budgeting
Author
Pakbaznia, Ehsan ; Pedram, Massoud
Author_Institution
Univ. of Southern California, Los Angeles, CA
fYear
2008
fDate
10-14 March 2008
Firstpage
385
Lastpage
390
Abstract
Power gating is one of the most effective techniques in reducing the standby leakage current of VLSI circuits. In this paper we introduce a new approach for sleep transistor sizing which minimizes the total sleep transistor width for a coarse-grain multi-threshold CMOS circuit assuming a given standard cell and sleep transistor placement. First, the circuit is decomposed into a set of modules, each containing the set of logic cells that are closest to a sleep transistor cell. Next given an upper bound on the overall circuit speed degradation, the global timing slack is distributed among different clusters using a delay-budgeting. The slack distribution result is then used to size the sleep transistors such that the total sleep transistor width is minimized while accounting for the parasitic resistances of the virtual ground net. Results show that the proposed sizing algorithm produces sleep transistor sizes that are 40% smaller than those produced by previous approaches.
Keywords
CMOS integrated circuits; VLSI; integrated circuit design; leakage currents; transistor circuits; CMOS circuit assuming; MTCMOS sleep transistor sizing; VLSI circuits; delay budgeting; global timing slack; logic cells; power gating; standby leakage current; CMOS logic circuits; Clustering algorithms; Degradation; Delay; Leakage current; Logic circuits; Sleep; Timing; Upper bound; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location
Munich
Print_ISBN
978-3-9810801-3-1
Electronic_ISBN
978-3-9810801-4-8
Type
conf
DOI
10.1109/DATE.2008.4484711
Filename
4484711
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