DocumentCode :
3239410
Title :
Characterising the turn-off performance of multi-cathode GTO thyristors using thermal imaging
Author :
Palmer, P.R. ; Johnson, C.M.
Author_Institution :
Dept. of Eng., Cambridge Univ., UK
fYear :
1989
fDate :
26-29 Jun 1989
Firstpage :
343
Abstract :
The thermal imaging of a GTO (gate turn-off thyristor) switching high currents is described. Results show that under certain gate drive and anode-cathode voltage conditions at turn-off, the anode current redistributes between cathode islands, greatly stressing some islands. From this, conclusions are drawn concerning GTO rating and circuit design
Keywords :
infrared imaging; thyristors; anode-cathode voltage conditions; multi-cathode GTO thyristors; switching high currents; thermal imaging; turn-off performance; Anodes; Cathodes; Circuit testing; Clamps; Switching circuits; Switching loss; Temperature measurement; Thermal engineering; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 1989. PESC '89 Record., 20th Annual IEEE
Conference_Location :
Milwaukee, WI
Type :
conf
DOI :
10.1109/PESC.1989.48508
Filename :
48508
Link To Document :
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