Title :
Memory Technology for Extended Large-Scale Integration in Future Electronics Applications
Author :
Pamunuwa, Dinesh
Author_Institution :
Dept. of Eng., Lancaster Univ., Lancaster
Abstract :
Extending 2-D planar topologies in integrated circuits (ICs) to a 3-D implementation has the obvious benefits of reducing the overall footprint and average interconnection length, with associated improvements in cost, and delay and energy consumption, while also providing an opportunity to integrate disparate technologies. Such advances are very much technology driven, and early research into 3-D integration has now crystallised into commercially viable options that are being pursued by many companies. Being able to position memory in closer proximity to processing elements in a NoC architecture as afforded by a 3-D physical architecture has the potential to improve the memory bandwidth and mitigate the general nature of delay constrained performance in IC design. Understanding the nature of the opportunities and constraints provided in such a 3-D physical architecture is crucial in realising the true benefits of 3-D integration in future applications.
Keywords :
integrated circuit technology; integrated memory circuits; large scale integration; network-on-chip; 2D planar topologies; 3D integrated circuits; 3D physical architecture; IC design; NoC architecture; energy consumption; integrated circuits; large-scale integration; memory technology; Bandwidth; Circuit topology; Costs; Crystallization; Delay; Energy consumption; Integrated circuit interconnections; Integrated circuit technology; Large scale integration; Network-on-a-chip;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
DOI :
10.1109/DATE.2008.4484828