DocumentCode
3241776
Title
LXI: A Shift in the Functional Test Paradigm
Author
Semancik, Jon
Author_Institution
VXI Technol., inc., Irvine, CA
fYear
2006
fDate
18-21 Sept. 2006
Firstpage
116
Lastpage
121
Abstract
LAN-based instrumentation, leveraging the advantages that LXI (LAN extensions for instrumentation) has to offer, has resulted in a paradigm shift in functional test methodology. The early days of test program design involved utilizing test instrumentation with parallel interfaces such as IEEE-488. These interfaces were slow and had limited bandwidth, but the response to individual message queries was relatively quick and ideal for multiple command- response sessions used for setup, control, and data gathering purposes. The very nature of LAN-based instrumentation requires a re-evaluation of this approach and with it the classis test paradigm. The TCP/IP protocol stack, triggering, synchronization, security, and inter-device interaction are fundamental areas of LAN-based test that provide tremendous opportunity, but also involve understanding any subtle differences that may exist. Other parallel advances in instrumentation such as powerful inexpensive digital signal processors, FPGA devices, and large onboard memory also has changed the way particular test sequences are implemented. The need to rely on the host computer for processor intensive operations is no longer needed, and therefore reduces the burden on both the communications interface and the host. This paper will address how the adoption of LAN-based instrumentation changes the way test engineers approach test program set (TPS) design. It will also provide recommendations to leverage the strengths that LAN-based test has to offer.
Keywords
automatic testing; local area networks; peripheral interfaces; transport protocols; FPGA devices; IEEE-488; LAN extensions for Instrumentation; LAN-based instrumentation; TCP-IP protocol stack; digital signal processors; functional test paradigm; interdevice interaction; large onboard memory; paradigm shifts; parallel interfaces; processor intensive operations; test program set; Bandwidth; Computer interfaces; Data security; Digital signal processors; Field programmable gate arrays; Instruments; Local area networks; Protocols; TCPIP; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2006 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
1-4244-0051-1
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2006.283667
Filename
4062348
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