Title :
Automatic data extraction from photoelasticity images
Author :
Quintero-Torres, Rafael ; Rodriguez-Rodriguez, Ezequiel ; Vazquez-Ceron, E.
Keywords :
Birefringence; Data mining; Optical polarization; Optical refraction; Optical retarders; Optical variables control; Photoelasticity; Prototypes; Refractive index; Stress;
Conference_Titel :
Electrical and Electronics Engineering, 2004. (ICEEE). 1st International Conference on
Print_ISBN :
0-7803-8531-4
DOI :
10.1109/ICEEE.2004.1433869
