• DocumentCode
    3242706
  • Title

    Performance Based Test - Example of Universal RF Tester with Built in Automated Diagnostics and Automated Probing for Manufacturing and Depot Level Testing

  • Author

    Lowenstein, Duane

  • Author_Institution
    Agilent Technol., Andover, MA
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    306
  • Lastpage
    310
  • Abstract
    This paper explores the strategy and processes used to simplify the specification, data and implementation of combining functional tests for multiple lowest replaceable units (LRUs) on a single tester at a cost and complexity the same as that of a similar single unit product tester. It shows that developing test strategies during the preliminary and detailed design reviews, companies can address many aspects of performance based logistics in terms of test processes that specifically can address cost, complexity and support throughout the products life cycle.
  • Keywords
    electronics industry; product life cycle management; test equipment; automated diagnostics; automated probing; depot level testing; lowest replaceable units; performance based test; products life cycle; universal RF tester; Automatic testing; Cost function; Electronic equipment testing; Life testing; Logistics; Manufacturing automation; Manufacturing processes; Pulp manufacturing; Radio frequency; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283675
  • Filename
    4062388