DocumentCode
3243108
Title
1200 V MCCT: a new concept three terminal MOS-gated thyristor
Author
Iwamuro, Noriyuki ; Iwaana, Tadayoshi ; Harada, Yuichi ; Seki, Yasukazu
Author_Institution
Adv. Device Technol. Lab., Fuji Electr. Corp. Res. & Dev. Ltd., Matsumoto, Japan
fYear
1997
fDate
26-29 May 1997
Firstpage
245
Lastpage
246
Abstract
High power semiconductor devices are required for various applications like a motor control in traction system. Desired device characteristics for such applications are low forward voltage drop, high current capability and large blocking voltage capability. Insulated Gate Bipolar Transistor (IGBT) is now widely accepted for many applications due to its simple gate control and current saturation feature, and many studies have been done for its high voltage application. It has been found that this device structure has a high forward voltage drop at a large current density when designed for the high voltage application. As an alternative, MOS-gated thyristor structures such as MOS Controlled Thyristor (MCT) and Base Resistance controlled Thyristor(BRT) have been studied for the high voltage application because of its simple gate drive capability and low forward voltage drop. However, since this device does not have the current saturation feature, passive protection must be provided for its stable operation. In this paper, a new class of MOS-gated thyristor structure named MOS Controlled Cascode Thyristor (MCCT) which exhibits a superior short circuit withstand capability as well as the low forward voltage drop will be demonstrated for the first time. Furthermore, this device shows a fast switching speed which is comparable to that of an IGBT and an excellent maximum turn-off capability, simultaneously
Keywords
MOS-controlled thyristors; current density; power semiconductor switches; 1200 V; MCCT; MOS controlled cascode thyristor; MOS-gated thyristor structures; blocking voltage capability; current capability; current density; forward voltage drop; gate drive capability; maximum turn-off capability; power semiconductor devices; short circuit withstand capability; switching speed; three terminal MOS-gated thyristor; Circuits; Current density; Insulated gate bipolar transistors; Low voltage; MOSFETs; Motor drives; Power semiconductor devices; Protection; Thyristors; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and IC's, 1997. ISPSD '97., 1997 IEEE International Symposium on
Conference_Location
Weimar
ISSN
1063-6854
Print_ISBN
0-7803-3993-2
Type
conf
DOI
10.1109/ISPSD.1997.601484
Filename
601484
Link To Document