• DocumentCode
    3243281
  • Title

    Phase change materials as a viable thermal interface material for high-power electronic applications

  • Author

    Ramaswamy, Chandrashekhar ; Shinde, Subhash ; Pompeo, Frank ; Sablinski, W. ; Bradley, Scott

  • Author_Institution
    IBM Corp., Hopewell Junction, NY, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    687
  • Abstract
    Phase change materials (PCMs) are an attractive alternative to thermal greases/pads. While their thermal conductivity is not as good as greases, they are more manufacturable. This paper reports on evaluation of PCMs for high power electronic applications. Conductivity measurements were carried out for several OEM PCMs. In addition experiments were carried out to determine process parameters (to attain target thermal impedance). A few candidates were then evaluated in a single chip module, under different environmental stresses and the results are presented here. The design concept was then extended to an MCM test vehicle and two candidate PCMs were evaluated. Differences in the reliability performance between SCM and MCM form factor are explained.
  • Keywords
    III-V semiconductors; alumina; aluminium; boron compounds; graphite; greases; integrated circuit packaging; integrated circuit reliability; internal stresses; multichip modules; thermal conductivity; wide band gap semiconductors; Al; Al2O3; BN; C; MCM test vehicle; PCM; environmental stresses; high power electronic applications; phase change materials; reliability; single chip module; thermal conductivity; thermal greases; thermal impedance; thermal interface material; thermal pads; Conducting materials; Conductivity measurement; Impedance; Manufacturing; Phase change materials; Power electronics; Testing; Thermal conductivity; Thermal stresses; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
  • Print_ISBN
    0-7803-8357-5
  • Type

    conf

  • DOI
    10.1109/ITHERM.2004.1318354
  • Filename
    1318354