• DocumentCode
    3243530
  • Title

    Fault Tree Reuse Across Multiple Reasoning Paradigms

  • Author

    Harris, Matthew W. ; Helton, Ashley ; Bodkin, Michael ; Ralph, Joseph

  • Author_Institution
    Lockheed Martin STS, Orlando, FL
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    496
  • Lastpage
    500
  • Abstract
    The development of a diagnostic model can be a very time-consuming and manually intensive process. One must first analyze the Test Program Set (TPS) to determine the fault tree and then integrate with that any additional knowledge that can be obtained from external data sources (such as test results, maintenance actions from the various maintenance levels, run-time failure information, etc.). The diagnostic models defined in the IEEE Std. 1232-2002 (AI-ESTATE) each define a different method that can be used for a diagnostic reasoner. It has been determined that each of these models utilize the information found in the basic TPS fault tree. As the fault tree represents hard won engineering knowledge that is expensive to reproduce, it is desirable to share the fault tree representations across multiple reasoner models. This paper will layout how each model type in the AI-ESTATE standard utilizes the fault tree to perform diagnostics and how, through the use of the XML representation of the AI-ESTATE fault tree model, that basic fault tree can be shared between reasoner models. It would also be desirable to find a way to gain that fault tree knowledge without having to manually reproduce it. As such, this paper will also describe how that information can at least be semi-automatically extracted from TPS design artifacts.
  • Keywords
    IEEE standards; XML; automatic test software; fault trees; inference mechanisms; AI-ESTATE standard; IEEE Std. 1232-2002; XML representation; diagnostic models; diagnostic reasoner; fault tree reuse; multiple reasoning paradigms; test program set; Failure analysis; Fault trees; Information analysis; Knowledge engineering; Lakes; Ontologies; Runtime; Sociotechnical systems; Testing; XML;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283713
  • Filename
    4062426