DocumentCode :
3243698
Title :
Solvation structure of impurity molecules in supercritical fluids studied by photoconductivity measurement and X-ray absorption fine structure (XAFS) spectroscopy
Author :
Nakagawa, Kazumichi ; Murata, Takatoshi
Author_Institution :
Fac. of Human Dev., Kobe Univ., Japan
fYear :
1999
fDate :
1999
Firstpage :
108
Lastpage :
109
Abstract :
Solvation structure of anthracene molecules and bromonaphthalene molecules doped in supercritical xenon fluids was studied on the basis of photoconductivity spectroscopy and X-ray absorption spectroscopy. It was concluded that values of ionization potential derived from photoconductivity measurements were sensitive for the association of xenon atoms onto the benzene rings of the anthracene molecule. Results from the X-ray absorption near-edge structure (XANES) spectra of bromonaphthalene in supercritical xenon and the local association of xenon atoms surrounding the Br atom were detected with high sensitivity
Keywords :
EXAFS; XANES; dielectric liquids; photoconductivity; solvation; XAFS; XANES; anthracene molecule; bromonaphthalene molecule; impurity molecules; ionization potential; photoconductivity; solvation structure; supercritical fluids; xenon fluid; Atomic measurements; Dielectrics; Electromagnetic wave absorption; Electrons; Impurities; Ionization; Photoconductivity; Spectroscopy; Synchrotron radiation; Xenon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dielectric Liquids, 1999. (ICDL '99) Proceedings of the 1999 IEEE 13th International Conference on
Conference_Location :
Nara
Print_ISBN :
0-7803-4759-5
Type :
conf
DOI :
10.1109/ICDL.1999.798881
Filename :
798881
Link To Document :
بازگشت