Modulation classification by means of different orders statistical moments

Author

Martret, Christophe J Le ; Boiteau, Denys M.

Author_Institution

CELAR, Bruz, France

Volume

3

fYear

1997

fDate

2-5 Nov 1997

Firstpage

1387

Abstract

This paper deals with modulation classification of 4PSK (4 states phase shift keying) and 16QAM (16 states quadrature amplitude modulation) using a pattern recognition approach. The discriminating feature is build as an optimized combination of fourth and second order moments in order to maximize the probability of correct classification (P_∞). This system is an extension of the one proposed in Boitreau and Le Martret (1996) where the discriminating feature is fourth order cumulant slice. Theoretical and experimental performances are presented for different signal to noise ratios (SNR) and are compared to the one obtained in Boitreau and Le Martret. A P_∞=0.99 is reached for SNR=0 dB and only 500 transmitted symbols

Keywords

higher order statistics; pattern classification; phase shift keying; quadrature amplitude modulation; 16QAM; 4PSK; correct classification probability; discriminating feature; fourth order cumulant slice; fourth order moments; modulation classification; optimized combination; pattern recognition; phase shift keying; quadrature amplitude modulation; second order moments; signal to noise ratio; statistical moments; Additive noise; Amplitude modulation; Baseband; Gaussian noise; Pattern recognition; Phase modulation; Phase shift keying; Quadrature amplitude modulation; Signal to noise ratio; Statistics;

fLanguage

English

Publisher

ieee

Conference_Titel

MILCOM 97 Proceedings

Conference_Location

Monterey, CA

Print_ISBN

0-7803-4249-6

Type

conf

DOI

10.1109/MILCOM.1997.644995

Filename

644995