DocumentCode :
3246703
Title :
The fractal analysis of the treeing process
Author :
Naoe, M. ; Ehara, Y. ; Kishida, H. ; Ito, T.
Author_Institution :
Dept. of Electr. & Electron. Eng., Musashi Inst. of Technol., Tokyo, Japan
Volume :
2
fYear :
1996
fDate :
20-23 Oct 1996
Firstpage :
779
Abstract :
The purpose of this study is to analyze the growth mechanism of trees which generate from a pointed tip of a needle electrode inserted into insulating materials. The fractal dimension of the discharge luminescence pattern was determined from fractal theory. The fractal analysis of the treeing process was performed by correlating the fractal dimension to the tree growth length, the quantity of luminescence in the tree area, and the luminous length measured in each phase angle area. One cycle of applied voltage was divided into twenty equal areas, which were marked by φ1~φ20 in order from one negative peak to the next negative peak of applied ac voltage. A correlation between the tree growth length and the fractal dimension of the discharge luminescence pattern of the tree region in φ7 and φ17 was obtained
Keywords :
electroluminescence; fractals; insulation testing; organic insulating materials; partial discharges; polymers; trees (electrical); PMMA; applied ac voltage; discharge luminescence pattern; fractal analysis; fractal dimension; insulating materials; luminous length; needle electrode; phase angle area; tree growth length; tree growth mechanism; treeing process; Area measurement; Electrodes; Fractals; Length measurement; Luminescence; Needles; Performance analysis; Performance evaluation; Trees - insulation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
Conference_Location :
Millbrae, CA
Print_ISBN :
0-7803-3580-5
Type :
conf
DOI :
10.1109/CEIDP.1996.564624
Filename :
564624
Link To Document :
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