• DocumentCode
    3246799
  • Title

    Design and Analysis of a New Loadless 4T SRAM Cell in Deep Submicron CMOS Technologies

  • Author

    Sandeep, R. ; Deshpande, Narayan T. ; Aswatha, A.R.

  • Author_Institution
    Dept of ECE, BMSCE, Bangalore, India
  • fYear
    2009
  • fDate
    16-18 Dec. 2009
  • Firstpage
    155
  • Lastpage
    161
  • Abstract
    The goal of this paper is to reduce the power and area of the Static Random Access Memory (SRAM) array while maintaining the competitive performance. Here the various configuration of SRAM array is designed using both the six-transistor (6T) SRAM cell and a new loadless four-transistor (4T) SRAM cell in deep submicron (130nm, 90nm and 65nm) CMOS technologies. Then it is simulated using HSPICE to check for its functionality, Static Noise Margin (SNM), power dissipation, area occupancy and access time. Except the precharge circuits and the basic storage cells, remaining part of the circuitry is same for both 6T SRAM array and New Loadless 4T SRAM array. Compared to the conventional 6T SRAM array, the new loadless 4T SRAM array consumes less power with less area in deep submicron CMOS technologies. Also the SNM of the new loadless 4T SRAM cell is as good as that of the 6T SRAM cell for higher values of Cell Ratio (CR).
  • Keywords
    CMOS memory circuits; SRAM chips; HSPICE simulation; SRAM array; access time; area occupancy; deep submicron CMOS technologies; loadless 4T SRAM cell; power dissipation; size 130 nm; size 65 nm; size 90 nm; static noise margin; static random access memory; CMOS technology; Circuit noise; Circuit simulation; Design engineering; Driver circuits; MOSFETs; Microprocessors; Power dissipation; Random access memory; SRAM chips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Trends in Engineering and Technology (ICETET), 2009 2nd International Conference on
  • Conference_Location
    Nagpur
  • Print_ISBN
    978-1-4244-5250-7
  • Electronic_ISBN
    978-0-7695-3884-6
  • Type

    conf

  • DOI
    10.1109/ICETET.2009.67
  • Filename
    5395392