DocumentCode
3246799
Title
Design and Analysis of a New Loadless 4T SRAM Cell in Deep Submicron CMOS Technologies
Author
Sandeep, R. ; Deshpande, Narayan T. ; Aswatha, A.R.
Author_Institution
Dept of ECE, BMSCE, Bangalore, India
fYear
2009
fDate
16-18 Dec. 2009
Firstpage
155
Lastpage
161
Abstract
The goal of this paper is to reduce the power and area of the Static Random Access Memory (SRAM) array while maintaining the competitive performance. Here the various configuration of SRAM array is designed using both the six-transistor (6T) SRAM cell and a new loadless four-transistor (4T) SRAM cell in deep submicron (130nm, 90nm and 65nm) CMOS technologies. Then it is simulated using HSPICE to check for its functionality, Static Noise Margin (SNM), power dissipation, area occupancy and access time. Except the precharge circuits and the basic storage cells, remaining part of the circuitry is same for both 6T SRAM array and New Loadless 4T SRAM array. Compared to the conventional 6T SRAM array, the new loadless 4T SRAM array consumes less power with less area in deep submicron CMOS technologies. Also the SNM of the new loadless 4T SRAM cell is as good as that of the 6T SRAM cell for higher values of Cell Ratio (CR).
Keywords
CMOS memory circuits; SRAM chips; HSPICE simulation; SRAM array; access time; area occupancy; deep submicron CMOS technologies; loadless 4T SRAM cell; power dissipation; size 130 nm; size 65 nm; size 90 nm; static noise margin; static random access memory; CMOS technology; Circuit noise; Circuit simulation; Design engineering; Driver circuits; MOSFETs; Microprocessors; Power dissipation; Random access memory; SRAM chips;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Trends in Engineering and Technology (ICETET), 2009 2nd International Conference on
Conference_Location
Nagpur
Print_ISBN
978-1-4244-5250-7
Electronic_ISBN
978-0-7695-3884-6
Type
conf
DOI
10.1109/ICETET.2009.67
Filename
5395392
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